Repeatability And Comparability Of A Swept-Source Oct Biometry Device And The Gold Standard And The Effect On Post-Operative Refraction Using Bayesian Statistics
Published 2026 - 44th Congress of the ESCRS
Reference: POCAT582 | Type: Poster | DOI: 10.82333/saz9-a391
Authors: Julia Babinger* 1 , Sophia Reifeltshammer 1 , Leon Pomberger 2 , Matthias Bolz 2 , Nino Hirnschall 2
1Kepler Universitätsklinikum, Linz ,Linz,Austria, 2Kepler Universitätsklinikum ,Linz,Austria
Purpose
Evaluation of the repeatability and comparability of a swept-source OCT biometry device to the gold standard and the effect on post-operative refraction using Bayesian statistics.
Setting
University Clinic for Ophthalmology and Optometry, Johannes Kepler University, Linz
University Clinic for Ophthalmology and Optometry, Kepler University Hospital, Linz
Methods
In this retrospective study, patients scheduled for bilateral cataract surgery were included. Study-related measurements were performed preoperatively and included optical biometry using the IOLMaster 700 (Carl Zeiss Meditec AG, Germany) and two measurements with a swept-source OCT device (Anterion, Heidelberg Engineering, Germany). Postoperative subjective refraction was performed. Measurements were analyzed using descriptive statistics and Bland–Altman plots. Furthermore, an error analysis was conducted using the postoperative refractive error as the primary outcome variable. This error analysis was performed using Welch’s test and Bayesian statistics.
Results
A total of 50 patients were included in this study. Preliminary results showed a mean axial length of 24.59 mm with a mean difference between measurements of <0.01 mm (SD: 0.02 mm) and a mean anterior chamber depth of 3.21 mm with a mean difference between measurements of 0.01 mm (SD: 0.01 mm). A detailed analysis, including comparability with the IOLMaster 700 and Bayesian statistics, will be presented at the annual meeting.
Conclusions
Preliminary data demonstrate very good repeatability of the SS-OCT device and good comparability with the IOLMaster 700. The error analysis will be presented at the annual meeting.